6 results
In-Situ Observation and Characterization of Structural Evolution in a Phase-Change Memory Device by TEM-STM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 716-717
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- July 2009
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Fabrication and Characterization of Single Nanowire and Nanotube Devices
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 720-721
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- August 2007
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HRTEM Study on the Interface of Si-based Resonant Tunneling Diodes (RTD) by UHV Wafer Bonding Technology
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 804-805
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- August 2007
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Fabrication of Three-Dimensional Devices with Various Nano Components Using a Combination of a FIB System and Nano Manipulation
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1514-1515
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- August 2007
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Electrical Characterization of a Single TiO2 Nanotube by Using Modified FIB/SEM
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1272-1273
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- August 2006
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Analysis of Defects in HgCdTe and CdTe Epilayers on Si by Dual-Beam FIB
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1274-1275
- Print publication:
- August 2006
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