32 results
F21 Abnormal X-ray Emission from Insulators Bombarded with Low Energy Ions
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
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- 20 May 2016, p. 186
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A Spatial Study of X-ray Properties in Superbubble 30 Dor C with XMM-Newton
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- Proceedings of the International Astronomical Union / Volume 11 / Issue A29B / August 2015
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- 27 October 2016, p. 737
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- August 2015
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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 532-533
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- July 2012
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Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 332-333
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- July 2012
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Electric field influence on emission of characteristic X-ray from Al2O3 targets bombarded by slow Xe+ ions
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- Powder Diffraction / Volume 21 / Issue 2 / June 2006
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- 01 March 2012, pp. 156-157
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Development of Sample-Scanning Electron Holography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 09 April 2017, pp. 1230-1231
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- July 2011
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Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1836-1837
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- July 2010
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Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1888-1889
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- July 2010
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Deconvolution Method Used in Improving the Depth Resolution of Three-Dimensional Images Taken by Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 290-291
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- July 2010
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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1834-1835
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- July 2010
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Interfaces of Xe Inclusions Ion-implanted in Al - Ordering in a Fluid Xe and Matrix Oxidation at Surfaces
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1360-1361
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- July 2009
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Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 612-613
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- July 2009
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Three Dimensional Characterization of Xe Inclusions Ion-implanted in Al
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1376-1377
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- July 2009
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Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 636-637
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- July 2009
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Development of Stage-Scanning Type Confocal STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 816-817
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- August 2008
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In Situ Transmission Electron Microscopy
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- MRS Bulletin / Volume 33 / Issue 2 / February 2008
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- 31 January 2011, pp. 83-90
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- February 2008
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Observation of the Selective Deposition and Growth of Metal Nano-Structures with In-situ UHV Electron Microscopy
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 554-555
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- August 2007
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Electron-diffraction study on ∈-iron nitride powders with various nitrogen contents: Variation of long-range nitrogen ordering
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- Journal of Materials Research / Volume 21 / Issue 10 / October 2006
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- 03 March 2011, pp. 2572-2581
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- October 2006
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Influence of Beam Energy and Probe Size on the Process of Electron-Beam-Induced Deposition
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 646-647
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- August 2006
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The Development of Ultra-high Vacuum Cs-Corrected Scanning Transmission Electron Microscope for Fast Fabrication of Desired Nanostructures
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1366-1367
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- August 2006
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