16 results
Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 854-855
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- August 2018
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Targeted Ion Milling of Ex Situ Lift-Out FIB Specimens
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 268-269
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- July 2017
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Theoretical 3D Imaging with He+ Ions
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 358-359
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- August 2013
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Characterization of Coatings with Ions and Electrons
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1862-1863
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- August 2013
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Enhancing Ex-Situ Lift-Out with EXpressLO
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 906-907
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- August 2013
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Comparison of Channeling Contrast between Ion and Electron Images
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- Microscopy and Microanalysis / Volume 19 / Issue 2 / April 2013
- Published online by Cambridge University Press:
- 18 March 2013, pp. 344-349
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- April 2013
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Ion Channeling vs. Electron Channeling Image Contrast
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 694-695
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- July 2012
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EXpressLO™ for Fast and Versatile FIB Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 632-633
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- July 2012
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The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation
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- Microscopy and Microanalysis / Volume 9 / Issue 3 / June 2003
- Published online by Cambridge University Press:
- 23 May 2003, pp. 216-236
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- June 2003
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In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 390-391
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- August 2002
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The FIB Lift-Out Specimen Preparation Technique for TEM Analyses and Beyond: SEM, AUGER, STEM, and SIMS Applications
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 888-889
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- August 1999
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TEM FIB Lift-Out of Mount Saint Helens Volcanic Ash
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 908-909
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- August 1999
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The UCF/CIRENT Materials Characterization Facility
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 468-469
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- July 1998
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Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 858-859
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- July 1998
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Comparison of Sputtered Titanium Nitride on Silicon Dioxide and Aluminum-Alloy Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 469-470
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- August 1997
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Focused Ion Beam Milling for Site Specific Scanning and Transmission Electron Microscopy Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 347-348
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- August 1997
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