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Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 194-199
- Print publication:
- June 2015
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Simulation of Space Charge Effects in Electron Optical System Based on the Calculations of Current Density
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 246-251
- Print publication:
- June 2015
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Calculation of Aberration Coefficients by Ray Tracing
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 26-27
- Print publication:
- September 2003
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