14 results
Powder micro-XRD of small particles
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- Powder Diffraction / Volume 25 / Issue 1 / March 2010
- Published online by Cambridge University Press:
- 29 February 2012, pp. 68-71
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Examination of the Gospel of Judas Using An Integrated Approach to Ink Characterization
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- Microscopy Today / Volume 14 / Issue 4 / July 2006
- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-15
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- July 2006
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Mesoporous, microporous and nanowired: electron microscopy of aerogel composites
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1240-1241
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- August 2002
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Transmission Electron Microscopy Studies of the Nanoscale Structure and Chemistry of Pt50Ru50 Electrocatalysts
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- Microscopy and Microanalysis / Volume 8 / Issue 1 / February 2002
- Published online by Cambridge University Press:
- 28 March 2002, pp. 50-57
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- February 2002
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Nanoscale Structural and Chemical Segregation in Pt50Ru50 Electrocatalysts
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1112-1113
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- August 2001
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Characterization of very low defect-density free-standing GaN Substrate Grown by Hydride-Vapor-Phase-Epitaxy.
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- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E2.3
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- 2001
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Effect of the Doping and the Al Content on the Microstructure and Morphology of Thin AlxGa1−xN Layers Grown by MOCVD
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 294-300
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- 2000
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Technical and Programmatic Features of the FAA's LAAS
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- The Journal of Navigation / Volume 52 / Issue 2 / May 1999
- Published online by Cambridge University Press:
- 01 May 1999, pp. 217-234
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- May 1999
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Atomic Scale Analysis of InGaN Multi-Quantum Wells
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- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 357
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- 1999
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Effect of the Doping and the Al Content on the Microstructure and Morphology of Thin AlxGa1-xN Layers Grown by MOCVD.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W3.77
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- 1999
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TEM Study of Defects in Laterally Overgrown GaN Layers
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 459-464
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- 1999
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Tem Study of Defects in Laterally Overgrown GaN Layers
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- MRS Online Proceedings Library Archive / Volume 537 / 1998
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- 15 February 2011, G4.6
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- 1998
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Role of Dopants and Impurities on Pinhole Formation; Defects Formed At Ingan/Gan And AlGaN/GaN Quantum Wells
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- MRS Online Proceedings Library Archive / Volume 482 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 375
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- 1997
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Electrical and Structural Properties of Ti Contacts on an Atomically Clean N-Type GaAs Surface
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- MRS Online Proceedings Library Archive / Volume 281 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 665
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- 1992
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