12 results
Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site
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- Journal:
- Microscopy Today / Volume 13 / Issue 1 / January 2005
- Published online by Cambridge University Press:
- 14 March 2018, pp. 26-29
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- January 2005
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Preparation of Large Area Site Specific Plan View TEM Samples by Combining Focused Ion Beam and Etching Techniques
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1162-1163
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- August 2004
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The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation
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- Microscopy and Microanalysis / Volume 9 / Issue 3 / June 2003
- Published online by Cambridge University Press:
- 23 May 2003, pp. 216-236
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- June 2003
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Energy Dispersive Spectrometry Calibration For The HD -2000 STEM
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1192-1193
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- August 2002
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Energy Dispersive Spectrometry Calibration of Fe and Co
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 200-201
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- August 2001
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A Stress Relief Method to Control Warping of Focused Ion Beam Prepared Membranes for Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 532-533
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- August 2000
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The FIB Lift-Out Specimen Preparation Technique for TEM Analyses and Beyond: SEM, AUGER, STEM, and SIMS Applications
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 888-889
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- August 1999
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Characterization of FIB Damage in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 740-741
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- August 1999
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Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 858-859
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- July 1998
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Comparison of Sputtered Titanium Nitride on Silicon Dioxide and Aluminum-Alloy Thin Films
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 469-470
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- August 1997
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Focused Ion Beam Milling for Site Specific Scanning and Transmission Electron Microscopy Specimen Preparation
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 347-348
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- August 1997
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A Comparative Study of Near-Surface Effects Due to Very High Fluence H+ Implantation In Single Crystal FZ, CZ, and Web SI*
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- MRS Online Proceedings Library Archive / Volume 27 / 1983
- Published online by Cambridge University Press:
- 25 February 2011, 359
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- 1983
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