12 results
Understanding High Contact Resistance in M0S2 FETs using STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1558-1559
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- August 2018
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Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM)
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 04 July 2017, pp. 794-808
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- August 2017
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Probing Two-dimensional (Bi,Sb)2Te3/h-BN Heterostructures Using Complementary S/TEM and Simulation Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1760-1761
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- July 2017
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Cross-sectional STEM Imaging and Spectroscopy of Devices with Embedded 2D Materials
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1440-1441
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- July 2017
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Simplifying Electron Beam Channeling in STEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 410-411
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- July 2017
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Challenges of Oversimplifying Z-contrast in Atomic Resolution ADF-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 946-947
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- July 2016
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S/TEM Investigation of the Structure of (Bi,Sb)2Te3/h-BN Heterostructures Grown by Molecular Beam Epitaxy
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1602-1603
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- July 2016
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Suppressing crystallization in solution-processed thin films of organic semiconductors
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- Journal:
- MRS Communications / Volume 5 / Issue 3 / September 2015
- Published online by Cambridge University Press:
- 12 August 2015, pp. 447-452
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- September 2015
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Measuring the Atomic and Electronic Structure of Black Phosphorus with STEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 109-110
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- August 2015
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Contributors
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- Book:
- Silverberg's Principles and Practice of Surgical Pathology and Cytopathology
- Published online:
- 13 March 2015
- Print publication:
- 26 March 2015, pp vii-x
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Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1796-1797
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- August 2014
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Contributors
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- Book:
- The Essence of Analgesia and Analgesics
- Published online:
- 06 December 2010
- Print publication:
- 14 October 2010, pp xi-xviii
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