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Off-Axis Electron Holography of Unbiased and Reverse-Biased Focused Ion Beam Milled Si p-n Junctions
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue 1 / February 2005
- Published online by Cambridge University Press:
- 28 January 2005, pp. 66-78
- Print publication:
- February 2005
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An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1012-1013
- Print publication:
- August 2004
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- Article
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