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Energy filtered imaging in a FEG-SEM for enhanced dopant contrast
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 718-719
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- August 2002
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Interfaces and Defects in Opto-Electronic Semiconductor Films Studied by Atomic Resolution STEM
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 461-462
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- August 1997
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Characterization of Ultrathin Doping Layers in Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue 4 / July 1997
- Published online by Cambridge University Press:
- 31 January 2003, pp. 352-363
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- July 1997
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Electron Beam Induced Crystallisation in Iron (III) Fluoride
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- Journal:
- MRS Online Proceedings Library Archive / Volume 398 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 195
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- 1995
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A Model for Estimating the Stress Induced During Oxidation of Sharp Silicon Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 389 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 191
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- 1995
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Hrem Lattice Image Simulations of Circular Cross-Sectional Multishell Carbon Nanotubes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 359 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 247
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- 1994
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Experimental Tem and Image Simulation of <A> Dislocations in Ti3A1
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- Journal:
- MRS Online Proceedings Library Archive / Volume 364 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 659
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- 1994
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Dislocation Behaviour in GexSi1-x Epilayers on (001)Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 160 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 71
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- 1989
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Growth and Characterization of Heteroepitaxial GaAs on Semiconductor-on-Insulator and Insulating Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 145 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 297
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- 1989
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Dislocation Nucleation in GeSi/Si(100) Strained Epilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 138 / 1988
- Published online by Cambridge University Press:
- 28 February 2011, 397
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- 1988
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