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Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 5 / October 2010
- Published online by Cambridge University Press:
- 16 July 2010, pp. 604-613
- Print publication:
- October 2010
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- Article
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