29 results
The Orientation of the Principal Axes System of the Electric Field Gradient in Fe (III) Vermiculite Determined by Mössbauer Spectroscopy
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- Clays and Clay Minerals / Volume 23 / Issue 4 / August 1975
- Published online by Cambridge University Press:
- 01 July 2024, pp. 332-334
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Comparative study of structural properties and photoluminescence in InGaN layers with a high In content
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 703-709
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- 2000
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Comparative Study of Structural Properties and Photoluminescence in InGaN Layers with a High in Content
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- MRS Online Proceedings Library Archive / Volume 595 / 1999
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- 03 September 2012, F99W11.38
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- 1999
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Influence of SiGe Thickness on the Co/SiGe/Si Solid State Reaction
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 151
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- 1999
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Controlled Phase Formation by Using a Diffusion Barrier - The Fe-Si REACTION
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- MRS Online Proceedings Library Archive / Volume 580 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 123
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- 1999
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Growth of Co ON Ag(100): A Comparison of Ultra Low Energyion Beam Deposition and Thermal Deposition
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- MRS Online Proceedings Library Archive / Volume 585 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 9
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- 1999
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New Approaches for Formation of Ultra-Thin PtSi Layers for Infrared Applications
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- MRS Online Proceedings Library Archive / Volume 525 / 1998
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- 10 February 2011, 307
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- 1998
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Formation and Thermal Stability of Nd0.32Y0.68Si1.7 Layers Formed by Channeled Ion Beam Synthesis
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- MRS Online Proceedings Library Archive / Volume 514 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 191
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- 1998
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Lattice Sites and Stability of Implanted Er in FZ and CZ Si
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- MRS Online Proceedings Library Archive / Volume 486 / 1997
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- 10 February 2011, 269
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- 1997
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Lattice Sites and Damage Annealing of Implanted Tm and Er IN Si
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- MRS Online Proceedings Library Archive / Volume 469 / 1997
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- 15 February 2011, 407
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- 1997
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High quality GdSil.7 layers formed by high dose channeled implantation
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- MRS Online Proceedings Library Archive / Volume 427 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 535
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- 1996
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Microstructural Studies of Co Silicide Layers Formed on SiGe and SiGeC
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- MRS Online Proceedings Library Archive / Volume 448 / 1996
- Published online by Cambridge University Press:
- 03 September 2012, 359
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- 1996
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Structural Characterization of Ion Beam Synthesized Epitaxial ErSi2-x Layers
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- MRS Online Proceedings Library Archive / Volume 402 / 1995
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- 15 February 2011, 499
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- 1995
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RTA-Preparation of β-FeSi2 Layers from MBE-Grown Fe-Si Films Deposited on Si and Relaxed SiGe (100) Substrates
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- MRS Online Proceedings Library Archive / Volume 387 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 407
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- 1995
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Temperature Dependence and Annealing Behaviour of Hf Implanted (100)Si: HfSi 2 Synthesis
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- MRS Online Proceedings Library Archive / Volume 402 / 1995
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- 15 February 2011, 593
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- 1995
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Magnetic Phase Transition in the Csci Fesi Spacer in Fe/FeSi Multilayers
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- MRS Online Proceedings Library Archive / Volume 382 / 1995
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- 15 February 2011, 253
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- 1995
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Low Temperature Anneal of the Divacancy in P-Type Silicon
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- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 953
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- 1995
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Depth-Selective Investigation of Fe-Silicides Formed After Molecular Beam Epitaxy, Using Conversion Electron MÖSsbauer Spectrometry.
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- MRS Online Proceedings Library Archive / Volume 337 / 1994
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- 25 February 2011, 685
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- 1994
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Quantitative Rutherford Backscattering from Thin Films
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- MRS Bulletin / Volume 18 / Issue 1 / January 1993
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- 29 November 2013, pp. 32-40
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- January 1993
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The Influence of Implantation-Induced Non-Stoichionetry on the Epitaxial Recrystallization of CoSi2
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- MRS Online Proceedings Library Archive / Volume 320 / 1993
- Published online by Cambridge University Press:
- 03 September 2012, 203
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- 1993
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