10 results
Prioritizing studies of COVID-19 and lessons learned
-
- Journal:
- Journal of Clinical and Translational Science / Volume 5 / Issue 1 / 2021
- Published online by Cambridge University Press:
- 21 April 2021, e106
-
- Article
-
- You have access
- Open access
- HTML
- Export citation
Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1760-1761
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2404-2405
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 504-505
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2026-2027
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Non-destructive Imaging of Extend Defects in III-nitride Thin film Structures Using Electron Channelling Contrast Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 570-571
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1522-1523
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2217-2218
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 684-685
- Print publication:
- July 2012
-
- Article
- Export citation