5 results
You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2026-2027
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 906-907
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 1 / February 2014
- Published online by Cambridge University Press:
- 12 November 2013, pp. 55-60
- Print publication:
- February 2014
-
- Article
- Export citation
Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 684-685
- Print publication:
- July 2012
-
- Article
- Export citation