12 results
A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 412-413
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1806-1807
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Detection Systems of Ultra-High-Resolution SEMs
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 606-607
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1116-1117
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
A Detection System with Controlled Surface Sensitivity for a New UHR SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 24-25
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
A New SEM Column Combining Ultra-High Resolution and Flexible Scanning
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 38-39
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Design of an Ultra-High Resolution SEM for Enhanced Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 578-579
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
On the Calculation of SEM and FIB Beam Profiles
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 206-211
- Print publication:
- June 2015
-
- Article
-
- You have access
- Export citation
Novel Cathodoluminescence Detector with Extremely Large Field of View
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 912-913
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 306-307
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1104-1105
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 990-991
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation