36 results
Differential Phase Contrast Imaging by Magnetic-field-free Atomic Resolution Scanning Transmission Electron Microscope
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- Journal:
- / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2568-2569
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- August 2022
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Selected poster presentations from the American Association of Applied Linguistics conference 2021: Japanese university students’ lexical diversity development in essay writing through theme-based instruction
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- Language Teaching / Volume 54 / Issue 4 / October 2021
- Published online by Cambridge University Press:
- 02 August 2021, pp. 583-586
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- October 2021
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Direct atomistic defect observations by depth sectioning and dynamic STEM
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- / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2138-2139
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- August 2021
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Development of High-Speed Scan System for Atomic Resolution STEM
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- / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 2710-2712
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- August 2021
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Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't
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- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 442-443
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- August 2020
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TV-rate Atomic-resolution STEM Imaging
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- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1150-1151
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- August 2020
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Atomic-scale Analysis of Mechanical Response of SrTiO3 by MEMS-based in Situ STEM Mechanical Testing
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- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1838-1840
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- August 2020
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Improving the Depth Resolution of HAADF Sectioning by 3D Deconvolution
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- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3110-3111
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- August 2020
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Light Element Imaging Technique at Low Dose Condition by Processing Simultaneously Obtained STEM Images Using a Segmented Detector
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 484-485
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- August 2019
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In situ STEM Mechanical Experiments at Atomic-Resolution Using a MEMS Device
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1884-1885
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- August 2019
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Advanced Scanning Transmission Electron Microscopy as a Tool for Direct Real-Space Visualization and Artificial Control of Quantum Spin Textures
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 954-955
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- August 2019
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Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 60-61
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- August 2019
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Resolution Achievement of 40.5 pm in Scanning Transmission Electron Microscopy using 300 kV Microscope with Delta Corrector
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 120-121
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- August 2018
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Surface and Electric Field Imaging by Newly Designed Atomic-Resolution STEM
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 118-119
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- August 2018
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Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
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- / Volume 25 / Issue 6 / November 2017
- Published online by Cambridge University Press:
- 27 October 2017, pp. 36-41
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- November 2017
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Better Contrast for Imaging Defects by ABF
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- / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 480-481
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- July 2017
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Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors
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- / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 440-441
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- July 2017
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Numerical Procedures to determine Potential Distribution from Electronic Field Vectors observed in Differential Phase Contrast (DPC) imaging
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- / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 34-35
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- July 2017
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Differential Phase Contrast Imaging with Reduced Dynamical Diffraction Effect
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1412-1413
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- July 2017
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Three-Dimensional Point Defect Imaging by Large-angle Illumination STEM
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 424-425
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- July 2017
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