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In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 1 / February 2015
- Published online by Cambridge University Press:
- 22 December 2014, pp. 140-153
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- February 2015
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Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling
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- Journal:
- Microscopy Today / Volume 20 / Issue 2 / March 2012
- Published online by Cambridge University Press:
- 28 February 2012, pp. 12-16
- Print publication:
- March 2012
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