4 results
High Speed TEM Sample Preparation by Xe FIB
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 298-299
- Print publication:
- August 2014
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Combined EBL/IBL Nanopatterning on Silicon Nitride Membranes for Time-resolved Magnetic Transmission X-ray Microscopy Experiments
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 872-873
- Print publication:
- August 2013
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Fast 3D Tomography of C4 Solder Bump by Using Xe Plasma Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 860-861
- Print publication:
- August 2013
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Combined plasma FIB-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 652-653
- Print publication:
- July 2012
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