16 results
Mechanical Properties of Cu/Ta Multilayers Prepared by Magnetron Sputtering
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- Journal:
- MRS Online Proceedings Library Archive / Volume 522 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 269
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- 1998
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Structural Transition in Cu/Fe Multilayered Thin Films
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- MRS Online Proceedings Library Archive / Volume 441 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 353
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- 1996
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Stress, Microstructure, and Thermal Behavior in Mo/Si X-Ray Multilayers
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- MRS Online Proceedings Library Archive / Volume 382 / 1995
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- 15 February 2011, 297
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- 1995
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Intrinsic Stress in Sputtered Thin Films
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- MRS Online Proceedings Library Archive / Volume 356 / 1994
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- 21 February 2011, 131
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- 1994
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Intrinsic Stress and Microstructural Evolution in Sputtered Nanometer Single and Multilayered Films
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- MRS Online Proceedings Library Archive / Volume 343 / 1994
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- 15 February 2011, 579
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- 1994
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Microstructure - Stress - Property Relationships in Nanometer Ge/C Multilayers
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- MRS Online Proceedings Library Archive / Volume 343 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 585
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- 1994
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Stability of Ruthenium-Silica Bilayer Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 343 / 1994
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- 15 February 2011, 149
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- 1994
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Diffusion-Induced Precipitation in Arsenosilicate Glass (AsSG)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
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- 22 February 2011, 83
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- 1994
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Reaction study of cobalt and silicon nitride
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- Journal:
- Journal of Materials Research / Volume 8 / Issue 9 / September 1993
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2354-2361
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- September 1993
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Microstructure - Roughness Interelation in Ru/C and Ru/B4C X-RAY Multilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 280 / 1992
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- 25 February 2011, 161
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- 1992
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Interactions in and Interfacial Structure of Annealed Co / a-Si3N4 Studied by Hrtem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 284 / 1992
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- 22 February 2011, 57
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- 1992
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Structural and Interfacial Characteristics of thin (<10 nm) SiO2 Films Grown by Electron Cyclotron Resonance Plasma Oxidation on [100] Si Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 223 / 1991
- Published online by Cambridge University Press:
- 16 February 2011, 75
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- 1991
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The Microstructural Evolution of Nanometer Ruthenium Films in Ru/C Multilayers With Thermal Treatments
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- Journal:
- MRS Online Proceedings Library Archive / Volume 230 / 1991
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- 26 July 2012, 109
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- 1991
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Lpcvd Polycrystalline Silicon Thin Films: The Evolution of Structure, Texture and Stress
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- MRS Online Proceedings Library Archive / Volume 202 / 1990
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- 25 February 2011, 167
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- 1990
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Microstructure and Stability Comparison of Nanometer Period W/C, Wc/C, and Ru/C Multilayer Structures
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- MRS Online Proceedings Library Archive / Volume 187 / 1990
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- 21 February 2011, 95
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- 1990
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High Resolution Electron Microscopy Study of As-Prepared and Annealed Tungsten-Carbon Nultilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
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- 21 February 2011, 357
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- 1989
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