12 results
EBSD of Rough Native CuInGaSe2 Thin-Films
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3442-3444
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- August 2021
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Quantitative misfit dislocation characterization with electron channeling contrast imaging
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 912-914
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- August 2021
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Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 202-203
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- August 2019
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Characterization of Sub-Bandgap Plasmon Excitations in Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 600-601
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- August 2019
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Characterization of Sub-Bandgap Energy States in CuInxGa(i-x)Se2 and Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 456-457
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- August 2018
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Nano-Cathodoluminescence Measurement of Asymmetric Carrier Trapping and Radiative Recombination in GaN and InGaN Quantum Disks
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- Microscopy and Microanalysis / Volume 24 / Issue 2 / April 2018
- Published online by Cambridge University Press:
- 27 April 2018, pp. 93-98
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- April 2018
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Detecting Sub Bandgap Energies in CIGS with Electron Energy-Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1546-1547
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- July 2017
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Advancement of Heteroepitaxial III-V/Si Thin Films through Defect Characterization
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1538-1539
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- July 2016
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Accessing High Spatial Resolution Low-Loss EELS Information without Cerenkov Radiation
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 976-977
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- July 2016
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Metamorphic epitaxy for multijunction solar cells
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- MRS Bulletin / Volume 41 / Issue 3 / March 2016
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- 14 March 2016, pp. 202-209
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- March 2016
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Site-Specific TEM Specimen Preparation of Samples with Sub-Surface Features
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2157-2158
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- August 2015
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Novel Applications of Electron Channeling Contrast Imaging
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1897-1898
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- August 2015
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