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The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2026-2027
- Print publication:
- August 2021
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Multidimensional Sample Surface Analysis by AFM-in-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1798-1799
- Print publication:
- August 2020
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AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis
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- Journal:
- Microscopy Today / Volume 28 / Issue 3 / May 2020
- Published online by Cambridge University Press:
- 18 May 2020, pp. 38-46
- Print publication:
- May 2020
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Correlative Probe and Electron Microscopy CPEM™ – The Novel Technology for 3D Material Surface Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 430-431
- Print publication:
- August 2019
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