1 results
Determining On-Axis Crystal Thickness with Quantitative Position-Averaged Incoherent Bright-Field Signal in an Aberration-Corrected STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
- Published online by Cambridge University Press:
- 04 May 2012, pp. 720-727
- Print publication:
- August 2012
-
- Article
- Export citation