Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy

Is Sputtering Sufficient for Production of Replicas?

Remote Plasma Cleaning and Radical Recombination Rates

120 kV TEM Equipped with an Ultra High Resolution Lens and its Application

The First Results of the Low Voltage Cold-FE SEM/STEM System Equipped With EELS

Performance Evaluation of Dual Bruker XFlash6 | 100 EDS Detector Integrated in FEI Themis With Analytical Objective Pole Piece

Use Electrons Sparingly but Efficiently, the Battle to get All the Required Information Needed While Minimizing Dose and Maximizing Data Collection at the Highest Resolution

Xe plasma FIB Delayering of IC based on 14 nm node technology

TEM Phase Plate Imaging in Biological and Materials Science

Abstract

Optimizing the FEI Volta Phase Plate for Efficient and Artefact-free Data Acquisition

Contrast Enhancement of Long-Range Periodic Structures using Hole-Free Phase Plate

Contrast Enhancement of Nano-materials Using Phase Plate STEM

The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates

Structure of the Ebola Virus Nucleocapsid Core by Single Particle Cryo-Electron Microscopy

High-resolution Imaging of Reconstituted Protein-DNA Complexes Using Phase Plate Electron Cryo Microscopy

Solution Conformations of Peroxiredoxins Visualised by Volta Phase Plates

Cryo-FIB Sample Preparation for Cryo-ET With the Volta Phase Plate

In situStructure of Viral RNA by Cryo Electron Tomography with Volta Phase Plate, Energy Filtering and Direct Electron Counting

Phase Contrast Subtomogram Averaging at Sub-nm Resolution

Towards Understanding of Charging Effects of Conductive Thin-Film Based Phase Plates

Structural Characterization of Mutant Huntingtin Inclusion Bodies by Cryo-Electron Tomography

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

TEM Phase Plate Imaging in Biological and Materials Science

Abstract