Symposium G – Structure and Properties of Multilayered Thin Films
Research Article
Characterization of Asymmetric Polydiacetylene Ultrathin Films
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- 15 February 2011, 265
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Structure and Novel Electrical Effects in A-Si:H Based Multilayers Containing Discontinuous Metal Sublayers
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- 15 February 2011, 271
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In-Situ Observation of Stress in Cu/Pd Multilayers
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- 15 February 2011, 279
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In Situ Stress Measurements of Co-Based Multilayer Films
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- 15 February 2011, 285
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A Model of Superlattice Yield Stress and Hardness Enhancements
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- 15 February 2011, 291
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Stress, Microstructure, and Thermal Behavior in Mo/Si X-Ray Multilayers
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- 15 February 2011, 297
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Elastic Properties of Pure and Hydrogenated Ce/Fe Multilayer Films
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- 15 February 2011, 303
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Residual Stress, Mechanical Behavior and Electrical Properties of Cu/Nb Thin-Film Multilayers
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- 15 February 2011, 309
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Enhanced Hardness and Stress-Driven Delamination in Fe/Pt Multilayers
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- 15 February 2011, 315
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An in Situ High Voltage Electron Microscopy Technique for the Study of Deformation and Fracture: in Multilayered Materials
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- 15 February 2011, 321
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Beryllium-Based Multilayer Structures
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- 15 February 2011, 329
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Specular and Off-Specular X-Ray Scattering as Quantitative Structural Probes of Multilayers. Application to MN/IR(111) Superlattices
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- 15 February 2011, 339
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X-Ray Optical Properties of C/C-Multilayers Prepared by Pulsed Laser Deposition (PLD)
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- 15 February 2011, 345
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Pulsed Laser Deposition of Laterally Graded X-Ray Optical Multilayers on Substrates of Technical Relevance
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- 15 February 2011, 351
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Interfacial Reactions and Thermal Stability of Ultrahigh Vacuum Deposited Multilayered Mo/Si Structures
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- 15 February 2011, 357
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Metal/Al2O3 Multilayers As High-Temperature X-Ray Mirrors
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- 15 February 2011, 363
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Role of Crystallinity In Roughness of Ru/c Multilayers -An Amorphization Study
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- 15 February 2011, 369
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Production of Mo/si Multilayers At Increased Substrate Temperatures: The Effect On D-Spacing, Interface Roughness and Density.
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- 15 February 2011, 375
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Interference Effects In X-Ray Specular Reflectivity from Thin Films
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- 15 February 2011, 381
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Thermal Degradation of Tantalum-Nickel Thin Film Couples
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- 15 February 2011, 389
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