8 results
Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 796-797
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- August 2018
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Insights on Sample Topography in EDX Spectroscopy with Annular SDD Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1144-1145
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- August 2018
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A Compact High Solid Angle EDX Detector System for SEM and TEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 76-77
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- July 2017
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New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 42-43
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- July 2016
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Neural correlates of trait anxiety in fear extinction
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- Journal:
- Psychological Medicine / Volume 41 / Issue 4 / April 2011
- Published online by Cambridge University Press:
- 16 June 2010, pp. 789-798
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A Semiconductor-based Field-effect Platform for (Bio-)Chemical and Physical sensors: From Capacitive EIS Sensors and LAPS over ISFETs to Nano-scale Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 952 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0952-F08-02
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- 2006
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Correlation of Intermediate Ion Energy Induced Extended Defect Continuity to Enhanced Pinning Potential in Tl-2212 Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 504 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 177
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- 1997
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Hrtem of Extended Defects in Tl-2212 Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 439 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 639
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- 1996
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