12 results
Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 618-619
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1516-1517
- Print publication:
- July 2012
-
- Article
- Export citation
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
- Print publication:
- October 2008
-
- Article
- Export citation
Retardation, Surface and Interface Effects in VEELS
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1250-1251
- Print publication:
- August 2007
-
- Article
- Export citation
Structural and ferromagnetic properties of Cu-doped GaN
-
- Journal:
- Journal of Materials Research / Volume 22 / Issue 5 / May 2007
- Published online by Cambridge University Press:
- 18 July 2011, pp. 1396-1405
- Print publication:
- May 2007
-
- Article
- Export citation
A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1372-1373
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
High Resolution TEM at 80kV Acceleration Voltage – Is Approaching 1 Ångström Possible?
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1470-1471
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1370-1371
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Monochromated TEM/STEM and High-Resolution Electron Energy-Loss Spectroscopy (HREELS) of Extraterrestrial Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1384-1385
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Passive Layer Formation at Pt/PbTiO3 Interfaces Identified Using STEM and EFTEM
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1746-1747
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
High Spatial and Energy Resolution EELS using a Monochromated STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1434-1435
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Passive Layer Formation at Ferroelectric PbTiO3/Pt Interfaces Studied by EELS
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 875 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, O14.3
- Print publication:
- 2005
-
- Article
- Export citation