11 results
Physical and biological properties of early winter Antarctic sea ice in the Ross Sea
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- Journal:
- Annals of Glaciology / Volume 61 / Issue 83 / December 2020
- Published online by Cambridge University Press:
- 24 June 2020, pp. 241-259
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Study of Co2MnxFe1-xSi Heusler Alloy by Cs-corrected STEM Imaging and Atomic resolution X-ray Spectrum Imaging
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 364-365
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- July 2012
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Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD)
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 386-387
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- August 2008
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Advanced FIB-based sample preparation for 3D characterization of 45nm ICs
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1002-1003
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- August 2008
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The influence of crude oil on the growth of subantarctic marine bacteria
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- Antarctic Science / Volume 2 / Issue 2 / June 1990
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- 14 May 2004, pp. 123-127
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Effect of nutrient enrichments on the bacterial assemblage of Antarctic soils contaminated by diesel or crude oil
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- Polar Record / Volume 39 / Issue 4 / October 2003
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- 16 October 2003, pp. 309-318
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Novel Statistical Model for a Piece-Wise Linear Radiocarbon Calibration Curve
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- Radiocarbon / Volume 44 / Issue 1 / 2002
- Published online by Cambridge University Press:
- 18 July 2016, pp. 195-212
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- 2002
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Quantitative Thickness Measurements of Thin Oxides Using Low Energy Loss Filtered TEM Imaging
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 560-561
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- August 2001
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Combined Focused Ion Beam, Energy Filtered TEM and STEM Techniques for Semiconductor Device Defects Observation
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 944-945
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- August 2001
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Quantitative Analysis of Si1-xGex using Convergent Beam Electron Diffraction for Extinction Distance Measurements.
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 1084-1085
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- August 2000
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Thickness Measurement of Focused Ion Beam Thinned Silicon Crystals Using Convergent Beam.Electron Diffraction and Electron Energy Loss Spectroscopy.
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 898-899
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- August 1999
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