21 results
Large-Aperture STEM Hexapole Cs-Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2630-2632
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- August 2022
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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 618-619
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- August 2013
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Instrumental Resolution Limit By Magnetic Thermal Noise From Conductive Parts
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 598-599
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- August 2013
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High-Resolution TEM/STEM by means of advanced Instrumentation
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 304-305
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- August 2013
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Assessment of the TEM Information Limit by Means of Tilted Illumination
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 612-613
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- August 2013
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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1516-1517
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- July 2012
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Realization of the First Aplanatic Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1270-1271
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- July 2011
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Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration
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- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
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- 02 July 2010, pp. 393-408
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- August 2010
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Benefits of Simultaneous Cc- and Cs-Correction
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 114-115
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- July 2010
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High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1702-1703
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- July 2010
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New Possibilities for Off-axis Electron Holography by Hardware Aberration Correctors
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 94-95
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- July 2010
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Development of Correctors: From O. Scherzer to TEAM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 150-151
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- July 2009
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Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 184-185
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- July 2009
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First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1456-1457
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- July 2009
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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Progress on the Development of a Cc/Cs Corrector for TEAM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 800-801
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- August 2008
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First Experimental Results with Advanced Hexapole Cs-Correctors
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 4-5
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- September 2007
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Experimental Set-up of an Advanced Hexapole Cs-Corrector
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1148-1149
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- August 2007
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Uses of a STEM Cs-Corrector in Electron Diffractive Imaging
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 958-959
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- August 2007
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Sub-Ångstrom and sub-eV resolution with the analytical SATEM
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 6-7
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- August 2004
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