4 results
The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 2 / April 2010
- Published online by Cambridge University Press:
- 26 February 2010, pp. 183-193
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- April 2010
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Aberration-Corrected STEM Imaging of Ag on γ-Al2O3
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
- Published online by Cambridge University Press:
- 21 December 2007, pp. 98-103
- Print publication:
- February 2008
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Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 483-491
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- December 2006
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The 1s-State Analysis Applied to High-Angle, Annular Dark-Field Image Interpretation—When Can We Use It?
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
- Published online by Cambridge University Press:
- 22 January 2004, pp. 4-8
- Print publication:
- February 2004
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