Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 29
Biological Sample Preparation for SEM Imaging of Porcine Retina
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- Published online by Cambridge University Press:
- 28 February 2012, pp. 28-31
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- Cited by 29
Target Material Selection for Sputter Coating of SEM Samples
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- Published online by Cambridge University Press:
- 08 July 2019, pp. 32-36
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- Cited by 29
PeakForce Scanning Electrochemical Microscopy with Nanoelectrode Probes
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- Published online by Cambridge University Press:
- 26 October 2016, pp. 18-25
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- Cited by 29
Radiation Damage and Nanofabrication in TEM and STEM
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- Published online by Cambridge University Press:
- 21 May 2021, pp. 56-59
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- Cited by 28
Large-Area Phase Mapping Using PhAse Recognition and Characterization (PARC) Software
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- Published online by Cambridge University Press:
- 09 September 2016, pp. 12-21
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- Cited by 27
Growth of Surface Analysis and the Development of Databases and Modeling Software for Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy
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- Published online by Cambridge University Press:
- 18 March 2016, pp. 16-23
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- Cited by 26
The Scanning Confocal Electron Microscope
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- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-13
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- Cited by 26
On the Sub-Nanometer Resolution of Scanning Electron and Helium Ion Microscopes
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- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-13
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- Cited by 25
Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling
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- Published online by Cambridge University Press:
- 28 February 2012, pp. 12-16
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- Cited by 25
Getting Started with NIST* DTSA-II
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- Published online by Cambridge University Press:
- 11 January 2011, pp. 26-31
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- Cited by 24
Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
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- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
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- Cited by 24
EBSD Sample Preparation: Techniques, Tips, and Tricks
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- Published online by Cambridge University Press:
- 14 March 2018, pp. 44-49
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- Cited by 23
Huygens STED Deconvolution Increases Signal-to-Noise and Image Resolution towards 22 nm
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- Published online by Cambridge University Press:
- 05 November 2013, pp. 38-44
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- Cited by 23
Integrated Cryo-Correlative Microscopy for Targeted Structural Investigation In Situ
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- Published online by Cambridge University Press:
- 02 December 2021, pp. 20-25
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- Cited by 22
New Insights into the Atomic-Scale Structures and Behavior of Steels
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- Published online by Cambridge University Press:
- 23 July 2012, pp. 44-48
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- Cited by 22
Raising the Standard of Specimen Preparation for Aberration-Corrected TEM and STEM
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- Published online by Cambridge University Press:
- 11 January 2011, pp. 16-19
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- Cited by 21
Management, Analysis, and Simulation of Micrographs with Cloud Computing
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- Published online by Cambridge University Press:
- 14 March 2019, pp. 26-33
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- Cited by 21
Innovative Instrumentation for Analysis of Nanoparticles: The π Steradian Detector
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- Published online by Cambridge University Press:
- 26 June 2009, pp. 56-59
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- Cited by 20
Atomic Force Microscopy Imaging of Living Cells
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- Published online by Cambridge University Press:
- 08 November 2010, pp. 8-14
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- Cited by 20
A Practical Guide to Deconvolution of Fluorescence Microscope Imagery
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- Published online by Cambridge University Press:
- 28 January 2010, pp. 10-14
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