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Volume 15 - Supplement S2 - July 2009

Contents

Page 4 of 39

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

  • K Suenaga, Y Sato, Z Liu, M Koshino, C Jin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 122-123
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution Imaging and Spectroscopy of Graphene Using the TEAM 0.5

  • Z Lee, A Dato, K-J Jeon, R Erni, T Richardson, M Frenklach, V Radmilovic
  • Published online by Cambridge University Press:
    26 July 2009, pp. 124-125
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Microscopic Studies with Graphene

  • J Meyer, A Chuvilin, U Kaiser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 126-127
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • HRTEM Study of Lithographically Defined Silicon Nanowires

  • HC Floresca, K Trivedi, SJ Kang, W Hu, MJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 128-129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures

  • LF Allard, KL More, J Liu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 130-131
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural Analysis of Nanoparticles in Thermoelectric AgPb18SbTe20 Single Crystal

  • L Wu, J Zhou, J Zheng, Q Jie, Q Li, J Yang, Y Zhu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 132-133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of the 3-D Magnetic Vector Potential using Lorentz Transmission Electron Microscopy

  • C Phatak, E Humphrey, M DeGraef, A Petford-Long
  • Published online by Cambridge University Press:
    26 July 2009, pp. 134-135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging Shape Dependent Surface Plasmon Modes in Noble Metal Nanoparticles

  • S Aloni, Y Yin, AP Alivisatos
  • Published online by Cambridge University Press:
    26 July 2009, pp. 136-137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

  • L-Y Chang, S Lazar, B Bártová, GA Botton, C Hébert, A Fontcuberta i Morral
  • Published online by Cambridge University Press:
    26 July 2009, pp. 138-139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Irradiation Damage and Modifications of Materials

Abstract

  • Nanoparticles and Nanopores Induced by High-energy Electron Irradiation

  • N Jiang, S Dong, JCH Spence
  • Published online by Cambridge University Press:
    26 July 2009, pp. 140-141
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Ion Irradiation-Induced Changes in Surface Morphology of InSb

  • A Perez-Bergquist, X Xiang, Y Zhang, L Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 142-143
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Characterization of Materials for Responsible Energy Generation and Use

Abstract

  • Nanowires for Energy Applications: Fundamental Growth Studies

  • AF Marshall, IA Goldthorpe, M Koto, PC McIntyre, J Zhu, H Peng, DM Barnett, WD Nix, Y Cui
  • Published online by Cambridge University Press:
    26 July 2009, pp. 144-145
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Pt-Co Bimetallic Catalysts for PEM Fuel Cell Cathodes

  • KL More, KS Reeves, R Borup
  • Published online by Cambridge University Press:
    26 July 2009, pp. 146-147
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructural Characterization of CdTe and CIGS Thin Film Solar Cells by Analytical Transmission Electron Microscopy

  • U Sharma, D Susnitzky
  • Published online by Cambridge University Press:
    26 July 2009, pp. 148-149
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy

Abstract

  • Development of Correctors: From O. Scherzer to TEAM

  • M Haider, P Hartel, H Müller, S Uhlemann, J Zach
  • Published online by Cambridge University Press:
    26 July 2009, pp. 150-151
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?

  • AL Bleloch, M Gass, B Mendis, K Sader, B Schaffer, P Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 152-153
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

  • S Lazar, L-Y Chang, L Gunawan, Y Shao, GA Botton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 154-155
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

ArcheoMetallurgy: Analyses & Characterization

Abstract

  • Puddled or Forged? A Steel Bar in the Cathedral of México, from the XVIII Century

  • ME Noguez, D Mojica, R Sanchez, T Robert
  • Published online by Cambridge University Press:
    26 July 2009, pp. 156-157
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Steel Hull Corrosion of USS Arizona with Applications to Submerged Resources

  • DL Johnson, DJ Medlin, M Russell, DL Conlin, LE Murphy, JD Carr
  • Published online by Cambridge University Press:
    26 July 2009, pp. 158-159
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Instrumentation and Techniques

IMS Henry Clifton Sorby Award and Lecture

Abstract

  • Characteristics of Exfoliation Corrosion at Weldments in an Al-Zn-Mg Alloy

  • C Bagnall
  • Published online by Cambridge University Press:
    26 July 2009, pp. 160-161
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 4 of 39