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Volume 15 - Supplement S2 - July 2009

Contents

Page 6 of 39

Instrumentation and Techniques

David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications

Abstract

  • New Detector Architecture, for Electron Microscopes with SDDs

  • H Soltau, O Jaratschin, A Liebel, A Niculae, A Simsek, R Eckhard, K Hermenau, P Lechner, G Lutz, G Schaller, F Schopper, L Strüder
  • Published online by Cambridge University Press:
    26 July 2009, pp. 204-205
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of an Annular Four-channel Silicon Drift Detector with a Light Element Window

  • R Terborg, M Rohde
  • Published online by Cambridge University Press:
    26 July 2009, pp. 206-207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes

  • HS von Harrach, P Dona, B Freitag, H Soltau, A Niculae, M Rohde
  • Published online by Cambridge University Press:
    26 July 2009, pp. 208-209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration Correction in Energy Loss Spectrometers and Monochromators

  • O Krivanek, J Ursin, GJ Corbin, N Dellby, M Murfitt, C Own, Z Szilagyi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 210-211
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Automatic Correction of Spectral Aberrations in EELS

  • N Menon, M Barfels, P Thomas
  • Published online by Cambridge University Press:
    26 July 2009, pp. 212-213
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of TEM-SXES instruments for valence electron spectroscopy

  • M Terauchi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 214-215
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A New Wavelength Spectrometer for SEM Analysts

  • P Camus
  • Published online by Cambridge University Press:
    26 July 2009, pp. 216-217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A New Detector for Backscattered Helium Ions in the 30 keV Energy Range

  • S Sijbrandij, J Notte, B Thompson, C Huynh, C Sanford, L Scipioni
  • Published online by Cambridge University Press:
    26 July 2009, pp. 220-221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low-Energy Secondary Electron Filtering with Immersion Lens SEM

  • R Young, E Bosch, M Uncovsky, L Tuma
  • Published online by Cambridge University Press:
    26 July 2009, pp. 222-223
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Latest Developements in the New Wavelength Dispersive Solid-State Detector

  • D Lesher, Y Diawara, S Medved, R Durst, V Sedov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 224-225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reduce Correlated Noise in EELS Spectrum with High Quality Dark Reference

  • V-DH Hou
  • Published online by Cambridge University Press:
    26 July 2009, pp. 226-227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Performance of a Silicon-Drift Detector in 200kV TEM Environments

  • LF Allard, S Rozeveld
  • Published online by Cambridge University Press:
    26 July 2009, pp. 228-229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector

  • CL Collins, J Holland, SR Burgess, P Statham, N Rowlands
  • Published online by Cambridge University Press:
    26 July 2009, pp. 230-231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Real-Time Pulse Pile-up Recovery in X-ray Detector Data

  • PAB Scoullar, RJ Evans
  • Published online by Cambridge University Press:
    26 July 2009, pp. 232-233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Noise-Tolerant Method for Measuring MTF from Found-Object Edges in a TEM

  • PE Mooney
  • Published online by Cambridge University Press:
    26 July 2009, pp. 234-235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Image Quality Improvements in Thermionic Scanning Electron Microscopes

  • D Phifer, P Wandrol, T Vystavel
  • Published online by Cambridge University Press:
    26 July 2009, pp. 236-237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

  • P Ercius, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 238-239
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Novel Time-Resolved Fluorescence Microscope System Extended from the Deep UV-Visible to NIR (240nm - 1700nm)

  • L Chandler
  • Published online by Cambridge University Press:
    26 July 2009, pp. 240-241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 6 of 39