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Volume 15 - Supplement S2 - July 2009

Contents

Page 5 of 39

Instrumentation and Techniques

Exhibitor Symposium: Making the Nano-Future Real: Instruments and Techniques that are Impacting Todays Research for Tomorrows Breakthroughs

Abstract

  • Microwave Radiation is a Versatile Technology for Tissue Processing

  • RT Giberson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 162-163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

  • E Okunishi, I Ishikawa, H Sawada, F Hosokawa, M Hori, Y Kondo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 164-165
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of a Fast CCD Camera for Electron Diffraction Imaging in Conventional TEM

  • B Mollon, M Pan, Y Jia, P Mooney, T Sha
  • Published online by Cambridge University Press:
    26 July 2009, pp. 166-167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Versatile Monochromator Module for XHR SEM

  • A Henstra, J Chmelik, T Dingle, A Mangnus, G van Veen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 168-169
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System

  • H Stegmann, Y Ritz, D Utess, H-J Engelmann, E Zschech
  • Published online by Cambridge University Press:
    26 July 2009, pp. 170-171
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • X-Max Large Area SDD Detectors - Creating a Real Impact on Nano-Science

  • CL Collins, J Holland, SR Burgess, N Rowlands
  • Published online by Cambridge University Press:
    26 July 2009, pp. 172-173
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)

  • TS Nunney, O Mustonen, RG White
  • Published online by Cambridge University Press:
    26 July 2009, pp. 176-177
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EBSD Analysis of Strain

  • MM Nowell, SI Wright
  • Published online by Cambridge University Press:
    26 July 2009, pp. 178-179
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Advancements in Integrated Micro-XRF in the SEM

  • KC Witherspoon, BJ Cross, RD Lamb, PO Sjoman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 180-181
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Towards an FE-SEM as a complete analytical laboratory

  • JP Stodolka, MG Schweitzer, TA Albrecht
  • Published online by Cambridge University Press:
    26 July 2009, pp. 182-183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High and Low Beam Energy Imaging: Complementarity in a Monochromated XHR SEM

  • LY Roussel, I Gestmann, M Darus, F Morrissey, DJ Stokes
  • Published online by Cambridge University Press:
    26 July 2009, pp. 186-187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of a 200kV Atomic Resolution Analytical Electron Microscope

  • I Ishikawa, E Okunishi, H Sawada, Y Okura, K Yamazaki, T Ishikawa, M Kawazu, M Hori, M Terao, M Kanno, S Tanba, Y Kondo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 188-189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • LM-STEM Study of Dislocations in Thick Silicon

  • D Tang, A Rucki, H Cerva, P Schlossmacher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 190-191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A New and Fast Method for the Creation of 3D Micro and Nano Structures

  • JJL Mulders, JS Faber
  • Published online by Cambridge University Press:
    26 July 2009, pp. 192-193
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Efficiency CT (HECT) for Automated Alignment and Contrast Calibration of Projections in Quantitative TEM Tomography

  • WR Jarisch, AC Dohnalkova
  • Published online by Cambridge University Press:
    26 July 2009, pp. 194-195
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Hands Free, Automated Transmission Electron Microscopy (TEM) Wedge Sample Preparation.

  • E Raz-Moyal, D Erwin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 196-197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Latest Developments in Todays TEM Camera Systems

  • J Wickersham, J Krieger, C Huelk
  • Published online by Cambridge University Press:
    26 July 2009, pp. 198-199
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications

Abstract

  • Silicon Based Electron, Optical and X-ray Imagers

  • P Rehak
  • Published online by Cambridge University Press:
    26 July 2009, pp. 200-201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 5 of 39