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Volume 15 - Supplement S2 - July 2009

Contents

Page 7 of 39

Instrumentation and Techniques

David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications

Abstract

  • Development of a Micro Mass Spectrometer: Analysis of Particle Behavior in MEMS Ion Lens Systems

  • Z Russell, PE Russell, J Glass, C Parker, B Stoner, K Gilchrist, J Piascik
  • Published online by Cambridge University Press:
    26 July 2009, pp. 242-243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Quantitative Atom-Probe Tomography

Abstract

  • Applications of Spatial Distribution Maps for Advanced Atom Probe Reconstruction and Data Analysis

  • M Moody, B Gault, L Stephenson, S Ringer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 246-247
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Evaluation of Local Radii of Atom-Probe-Tomography Specimens

  • S Gerstl, BP Geiser, TF Kelly, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 248-249
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification

  • G Thompson, A Genc, R Morris, K Torres, HL Fraser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 250-251
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Cluster Detection and Quantification

  • DJ Larson, MK Miller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 252-253
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

  • D Diercks, BP Gorman, CL Cheung, G Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 254-255
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Background Removal Methods Applied to Atom Probe Data

  • E Oltman, R Ulfig, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 256-257
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Sensitivity And Quantitativity In Atom Probe Tomography

  • F Danoix, A Bostel, A Leitner, P Jessner, X Sauvage, M Gouné, R Danoix
  • Published online by Cambridge University Press:
    26 July 2009, pp. 258-259
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Promoting Standards in Quantitative Atom Probe Tomography Analysis

  • R Ulfig, TF Kelly, B Gault
  • Published online by Cambridge University Press:
    26 July 2009, pp. 260-261
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Review of Atom Probe Tomography Applications for Semiconductor materials

  • L Renaud, I Martin, B Salle, R Benbalagh, A Davis, M Schuhmacher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 262-263
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Data Mining and Informatics for Quantitative Atom Probe Tomography

  • K Rajan, S Aluru, B Ganapathysubramanian
  • Published online by Cambridge University Press:
    26 July 2009, pp. 264-265
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Partitioning Behavior of Al and Si in FINEMET Nanocrystalline Soft Magnetic Alloys, as Studied by Atom-Probe Tomography

  • K Knipling, M Daniil, M Willard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 266-267
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Grain Boundary Chemistry Before and After Ion Implantation in ODS Steels

  • EA Marquis, S Lozano-Perez, V de Castro
  • Published online by Cambridge University Press:
    26 July 2009, pp. 270-271
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Investigation of Self-assembled Monolayer by Atom Probe Microscopy

  • B Gault, W Yang, KR Ratinac, R Zheng, F Braet, SP Ringer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 272-273
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 3-D Atom Probe Tomography of Resin Embedded Samples?

  • JE Evans, I Arslan, DL Jaeger, EA Marquis, BP Gorman, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 274-275
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Impurity Measurments in Polycrystallline Material with Atom Probe Tomography

  • P Ronsheim, M Hatzistergos, P Flaitz
  • Published online by Cambridge University Press:
    26 July 2009, pp. 276-277
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM and Atom Probe Tomography Characterization of High TMR MgO-Based Magnetic Tunnel Junctions

  • PM Rice, S-H Yang, SSP Parkin, EA Marquis, TJ Prosa, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 278-279
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atom Probe Tomography Studies of GaN-Based Semiconductor Materials

  • SE Bennett, RA Oliver, DW Saxey, A Cerezo, PH Clifton, R Ulfig, MJ Kappers, CJ Humphreys
  • Published online by Cambridge University Press:
    26 July 2009, pp. 280-281
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 7 of 39