58 results
Rapid Atomic-Resolution Image Analysis: Towards Near-Instant Feedback
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 538-539
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- August 2018
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Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 98-99
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- August 2018
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Atomic Resolution STEM-EELS Studies of Defects and Local Structural Distortions in Oxide Interfaces
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 372-373
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- July 2017
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Moving atomic-resolution imaging into the age of deep data
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1607-1608
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- August 2015
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Physical Mechanisms Affecting the Reliability of GaN-based High Electron Mobility Transistors
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- MRS Online Proceedings Library Archive / Volume 1792 / 2015
- Published online by Cambridge University Press:
- 18 May 2015, mrss15-2147627
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- 2015
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Oxygen Vacancy Ordering: a Degree of Freedom that can Control the Structural, Electronic and Magnetic Properties of Transition-Metal Oxide Films
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 556-557
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- August 2014
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Vacancy breathing by grain boundaries—a mechanism of memristive switching in polycrystalline oxides
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- MRS Communications / Volume 3 / Issue 3 / September 2013
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- 09 September 2013, pp. 167-170
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- September 2013
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Probing Nanoparticle Magnetism by Aberration Corrected STEM-EELS
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1362-1363
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- July 2012
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Probing Interfaces Using a Combination of Scanning Transmission Electron Microscopy and Density-Functional Theory
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1316-1317
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- July 2011
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Simulation of STEM-EELS Including Diffraction and Solid-State Effects II: Adding the Experiment
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 810-811
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- July 2011
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Structure of White Light Emitting CdSe Nanocrystals
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1636-1637
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- July 2011
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Atomic Scale Study of Point Defects in Graphene using STEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1498-1499
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- July 2011
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Aberration Corrected STEM-EELS: Applications to Magnetic Materials
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 796-797
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- July 2011
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Simulation of STEM-EELS Including Diffraction and Solid-State Effects I: Mixed Dynamic Form Factor beyond the Dipole Approximation
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 808-809
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- July 2011
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Seeing oxygen disorder in YSZ/SrTiO3 colossal ionic conductor heterostructures using EELS
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- The European Physical Journal - Applied Physics / Volume 54 / Issue 3 / June 2011
- Published online by Cambridge University Press:
- 07 June 2011, 33507
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- June 2011
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Interface Structure-Property Relations Through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1420-1421
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- July 2010
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Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1480-1481
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- July 2009
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First-principles studies on organic electronic materials
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- The European Physical Journal - Applied Physics / Volume 46 / Issue 1 / April 2009
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- 05 March 2009, 12511
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- April 2009
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Direct Imaging of Point Defect Configurations for Au inside Si Nanowires
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 204-205
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- August 2008
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Spectroscopic Imaging of Oxide Interfaces with Aberration Corrected Probes
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 142-143
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- August 2007
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