16 results
Computationally Efficient Handling of Partially Coherent Electron Sources in (S)TEM Image Simulations via Matrix Diagonalization
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- Microscopy and Microanalysis , FirstView
- Published online by Cambridge University Press:
- 15 September 2022, pp. 1-9
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Adventures in Atomic Resolution in situ STEM
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2342-2343
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- August 2022
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ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 392-393
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- August 2022
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A Materials Scientist's CANVAS: A System for Controlled Alteration of Nanomaterials in Vacuum Down to the Atomic Scale
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2940-2942
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- August 2022
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Mapping pm-scale Lattice Distortions and Measuring Interlayer Separations in Stacked 2D Materials by Interferometric 4D-STEM
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1752-1754
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- August 2022
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Temperature-dependent displacement cross section of graphene and its impurities: measuring the carbon adatom migration barrier
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, p. 3340
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- August 2021
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Single indium atoms and few-atom indium clusters anchored onto graphene via silicon heteroatoms
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3346-3347
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- August 2021
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Atomistic Understanding of Damage and Beam-driven Dynamics in 2D Materials
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 542-543
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- August 2020
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abTEM: ab Initio Transmission Electron Microscopy Image Simulation
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 448-450
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- August 2020
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Quantitative Measurement and Utilization of Electron Irradiation Effects in 2D Materials
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 166
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- August 2020
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Uncovering the Mechanism for Electron-beam Manipulation of Dopants in Silicon
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2560-2561
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- August 2020
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Atomic-scale Chemical Manipulation of Materials in the Scanning Transmission Electron Microscope under Controlled Atmospheres
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1398-1399
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- August 2019
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Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 938-939
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- August 2019
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Automated Real-time Analysis of Atomic-resolution STEM Images
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 166-167
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- August 2019
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Quantifying Elastic and Inelastic Electron Irradiation Damage in Transmission Electron Microscopy of 2D Materials
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 454-455
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- August 2019
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Substitutional Si Doping of Graphene and Nanotubes through Ion Irradiation-Induced Vacancies
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1574-1575
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- August 2019
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