31 results
Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 222-224
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- August 2020
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Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1996-1997
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- August 2019
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Improvement of Spatial Resolution in Z Direction with Improved Energy Spread Measured using Aberration Corrected STEM with Cold Field Emission Gun
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 514-515
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- August 2019
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Measuring Single Electrons – What Does it Mean?
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 1654-1655
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- August 2019
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Investigation of Image Contrast in Biological Samples by Pixelated STEM Detector
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1694-1695
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- August 2019
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Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1514-1515
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- August 2018
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Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 978-979
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- August 2018
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Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 128-129
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- August 2018
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Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 198-199
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- August 2018
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Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
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- / Volume 25 / Issue 6 / November 2017
- Published online by Cambridge University Press:
- 27 October 2017, pp. 36-41
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- November 2017
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Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1790-1791
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- July 2017
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Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera
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- / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 58-59
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- July 2017
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Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 52-53
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- July 2017
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Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1084-1085
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- July 2017
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Accelerating Voltage and Probe Current Dependence of Electron Beam Drilling Rates for Silicon Crystal
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1828-1829
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- July 2017
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Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method
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- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 264-265
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- July 2016
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Contrast Enhancement of Nano-materials Using Phase Plate STEM
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- / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 62-63
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- July 2016
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Development of Phase Contrast Scanning Transmission Electron Microscopy and its application
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2301-2302
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- August 2015
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Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides
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- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1221-1222
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- August 2015
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Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1599-1600
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- August 2015
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