33 results
Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data.
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- Journal:
- / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 438-439
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- August 2022
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Optimized Ultra-Fast Low Dose Electron Detection
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- / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2198-2199
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- August 2022
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Development of the Silicon Drift Detector for Electron Microscopy Applications
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- Journal:
- / Volume 28 / Issue 5 / September 2020
- Published online by Cambridge University Press:
- 25 September 2020, pp. 46-53
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- September 2020
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Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition
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- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 222-224
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- August 2020
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News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 516-517
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- August 2019
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Optimizing Workflow in Electron Microscopes with Fast BSE/STEM Diodes and Preamplifier Modules
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 538-539
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- August 2019
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Ultrafast Ptychography with 7500 Frames per Second
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 40-41
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- August 2019
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Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 474-475
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- August 2019
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Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1768-1769
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- August 2019
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Detection of Low Energy X-rays with High Efficiency and Spectral Resolution
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- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 272-273
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- August 2019
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Measuring Single Electrons – What Does it Mean?
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 1654-1655
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- August 2019
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Investigation of Image Contrast in Biological Samples by Pixelated STEM Detector
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 1694-1695
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- August 2019
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Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 728-729
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- August 2018
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Micro-Focused Five Dimensional X-ray Imaging with the Color X-ray Camera
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 986-987
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- August 2018
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X-ray Detectors - in Heaven and on Earth
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 990-991
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- August 2018
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New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 650-651
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- August 2018
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A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 784-785
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- August 2018
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Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 198-199
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- August 2018
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Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 58-59
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- July 2017
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Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 52-53
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- July 2017
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