Characterization of High Tc Materials and Devices by Electron Microscopy

doi:10.1017/CBO9780511534829

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

‘… a useful and nearly comprehensive guide to current work in the subject.’

J. P. Davey Source: Contemporary Physics

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Contents

Frontmatter
pp i-iv
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Contents
pp v-ix
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List of contributors
pp x-xii
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Preface
pp xiii-xiv
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1 - High-resolution transmission electron microscopy
pp 1-22
- By S. Horiuchi, L. He
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2 - Holography in the transmission electron microscope
pp 23-38
- By A. Tonomura
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3 - Microanalysis by scanning transmission electron microscopy
pp 39-68
- By L. M. Brown, J. Yuan
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4 - Specimen preparation for transmission electron microscopy
pp 69-102
- By J. G. Wen
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5 - Low-temperature scanning electron microscopy
pp 103-124
- By R. P. Huebener
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6 - Scanning tunneling microscopy
pp 125-160
- By M. E. Hawley
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7 - Identification of new superconducting compounds by electron microscopy
pp 161-192
- By G. Van Tendeloo, T. Krekels
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8 - Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
pp 193-214
- By Y. Y. Wang, V. P. Dravid
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9 - Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
pp 215-234
- By Y. Zhu
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10 - Grain boundaries in high Tc materials: transport properties and structure
pp 235-262
- By K. L. Merkle, Y. Gao, B. V. Vuchic
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11 - The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7–δ
pp 263-284
- By N. D. Browning, M. F. Chisholm, S. J. Pennycook
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12 - Microstructures in superconducting YBa2Cu3O7 thin films
pp 285-318
- By A. F. Marshall
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13 - Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
pp 319-354
- By C. L. Jia, K. Urban
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14 - Controlling the structure and properties of high Tc thin-film devices
pp 355-391
- By E. Olsson
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Characterization of High Tc Materials and Devices by Electron Microscopy

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Contents

Frontmatter
pp i-iv

Contents
pp v-ix

List of contributors
pp x-xii

Preface
pp xiii-xiv

1 - High-resolution transmission electron microscopy
pp 1-22

2 - Holography in the transmission electron microscope
pp 23-38

3 - Microanalysis by scanning transmission electron microscopy
pp 39-68

4 - Specimen preparation for transmission electron microscopy
pp 69-102

5 - Low-temperature scanning electron microscopy
pp 103-124

6 - Scanning tunneling microscopy
pp 125-160

7 - Identification of new superconducting compounds by electron microscopy
pp 161-192

8 - Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
pp 193-214

9 - Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
pp 215-234

10 - Grain boundaries in high Tc materials: transport properties and structure
pp 235-262

11 - The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7–δ
pp 263-284

12 - Microstructures in superconducting YBa2Cu3O7 thin films
pp 285-318

13 - Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
pp 319-354

14 - Controlling the structure and properties of high Tc thin-film devices
pp 355-391

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Characterization of High Tc Materials and Devices by Electron Microscopy

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