The availability of synchrotron x-ray sources and the subsequent developments described in this book have led to substantial progress in our understanding of molecular ordering at liquid interfaces. This practical guide enables graduate students and researchers working in physics, chemistry, biology and materials science to understand and carry out experimental investigations into the basic physical and chemical properties of liquid surfaces and interfaces. The book examines the surfaces of bulk liquids, thin wetting films and buried liquid-liquid interfaces. It discusses experiments on simple and complex fluids, including pure water and organic liquids, liquid crystals, liquid metals, electrified liquid-liquid interfaces and interfacial monolayers of amphiphiles, nanoparticles, polymers and biomolecules. A detailed description of the apparatus and techniques required for these experiments is provided, and theoretical approaches to data analysis are described, including approximate methods such as the Master formula, the Born approximation, Parratt's algorithm and the Distorted Wave Approximation.

'… a real treasure trove for researchers of liquid surfaces and interfaces. Peter Pershan, a founding father and a prime motive in the field of synchrotron x-ray studies of liquid surfaces, and Mark Schlossman, a leading expert in the field, present an admirable combination of a comprehensive, in-depth, exposition of the experimental methods and their underlying theory and data analysis approaches, with a lucid discussion of selected results obtained using these methods. The book's first part is an invaluable guide for researchers wishing to enter the field. The second … is a broad, insightful and inspiring panorama of the field's major achievements, which is a joy to read … the selection … reflects elegantly the authors' wisdom, breadth of view, and 30 years of experience … this volume will find a place of honor on the bookshelves of all researchers … worldwide.'

Moshe Deutsch - Bar-Ilan University, Israel

'Anyone interested in learning about the physical properties of liquid surfaces will appreciate this comprehensive treatise that emphasizes synchrotron x-ray scattering methods. The book provides a rigorous approach to scattering theory as well as a practical guide on how to align instruments. Pershan and Schlossman present an excellent summary of our current understanding of the structure and thermal fluctuations observed at liquid interfaces with a wide range of examples extending from simple liquids to Langmuir monolayers. There is no doubt that this will become the standard for many years.'

Ben Ocko - Brookhaven National Laboratory

‘… Peter Pershan and Mark Schlossman, who are pioneers in the development of the modern experimental tools for the study of liquid interfaces, have written a masterful account of the uses of x-ray reflection and scattering to study liquid interfaces, and of the interpretation of the findings for many such interfaces. Their incisive treatment of the experimental methodology and the analysis of data obtained make this book a ‘must read’ for all physicists and chemists interested in liquid interfacial phenomena. This book will serve several purposes: as an introduction to the field for graduate students, as a reference to the subtleties of interpretation of data for active users of synchrotron radiation for interface studies, and as a thought-provoking survey of the many subtle properties of liquid interfaces and the differences and similarities of those properties across classes of liquids and contact media.'

Stuart A. Rice - University of Chicago