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  3. Reflection Electron Microscopy and Spectroscopy for Surface Analysis
  • Cited by 43
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    • Publisher:
      Cambridge University Press
      Publication date:
      January 2010
      May 1996
      ISBN:
      9780511525254
      9780521482660
      9780521017954
      DOI:
      https://doi.org/10.1017/CBO9780511525254
      Dimensions:
      (247 x 174 mm)
      Weight & Pages:
      0.93kg, 458 Pages
      Dimensions:
      (247 x 174 mm)
      Weight & Pages:
      0.731kg, 460 Pages
      • Subjects:
      Physics and Astronomy, Condensed Matter Physics, Nanoscience and Mesoscopic Physics, Engineering, Materials Science
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    • Selected: Digital
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    Subjects:
    Physics and Astronomy, Condensed Matter Physics, Nanoscience and Mesoscopic Physics, Engineering, Materials Science
    Information

    Book description

    In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

    Reviews

    ‘A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography … It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.’

    Andre Rocher Source: Measurement Science & Technology

    ‘For those with a TEM background it represents, perhaps, the definitive text for reflection methods … extremely readable … attractive style … Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.’

    John F. Watts Source: The Analyst

    ‘ … a very pleasing volume which should attract new users to these techniques.’

    P. W. Hawkes Source: Ultramicroscopy

    ‘ … this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.’

    Source: Aslib Book Guide

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