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    • Publisher:
      Cambridge University Press
      Publication date:
      July 2010
      December 2004
      ISBN:
      9780511735097
      9780521453738
      9780521184021
      Dimensions:
      (247 x 174 mm)
      Weight & Pages:
      0.894kg, 366 Pages
      Dimensions:
      (244 x 170 mm)
      Weight & Pages:
      0.6kg, 366 Pages
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    Book description

    Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.

    Reviews

    Review of the hardback:'For MBE [molecular beam epitaxy experts this book brings a concise and in depth description of the most salient features of modern MBE growth. For beginners it provides an excellent introduction to the fascinating field of MBE crystal growth.'

    Source: Chemistry World

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