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  3. Statistical Inference for Spatial Processes
  • Cited by 515
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    • Publisher:
      Cambridge University Press
      Publication date:
      June 2012
      November 1988
      ISBN:
      9780511624131
      9780521424202
      DOI:
      https://doi.org/10.1017/CBO9780511624131
      Dimensions:
      Weight & Pages:
      Dimensions:
      (228 x 152 mm)
      Weight & Pages:
      0.24kg, 160 Pages
      • Subjects:
      Computer Science, Pattern Recognition and Machine Learning, Statistical Theory and Methods, Statistics and Probability
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    Subjects:
    Computer Science, Pattern Recognition and Machine Learning, Statistical Theory and Methods, Statistics and Probability
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    Book description

    The study of spatial processes and their applications is an important topic in statistics and finds wide application particularly in computer vision and image processing. This book is devoted to statistical inference in spatial statistics and is intended for specialists needing an introduction to the subject and to its applications. One of the themes of the book is the demonstration of how these techniques give new insights into classical procedures (including new examples in likelihood theory) and newer statistical paradigms such as Monte-Carlo inference and pseudo-likelihood. Professor Ripley also stresses the importance of edge effects and of lack of a unique asymptotic setting in spatial problems. Throughout, the author discusses the foundational issues posed and the difficulties, both computational and philosophical, which arise. The final chapters consider image restoration and segmentation methods and the averaging and summarising of images. Thus, the book will find wide appeal to researchers in computer vision, image processing, and those applying microscopy in biology, geology and materials science, as well as to statisticians interested in the foundations of their discipline.

    Reviews

    ‘ … this monograph is required reading for anyone interested in the theory of spatial processes.’

    Source: Biometrics

    ‘All in all, a beautiful introduction to this important area and highly recommended.’

    Mededelingen van het Wiskundig Genootschap

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