Hostname: page-component-7dd5485656-dk7s8 Total loading time: 0 Render date: 2025-10-30T22:16:15.869Z Has data issue: false hasContentIssue false
  • English
  • Français

Complicated Average Stress-Fields and Attempts at Their Evaluation With X-Ray Diffraction Methods

Published online by Cambridge University Press:  06 March 2019

H. Ruppersberg
H. Ruppersberg*
Affiliation:
F.B. Werkstoffwissenschaften und Fertigungstechnik Universität des Saarlandes Postfach 11 50 D-66041 Saarbrūcken, Germany
Get access

Abstract

Conventional X-ray stress analysis is based on the so called "linear sin2ψ" law and yields average two axial stresses in the irradiated surface layer of polycrystalline specimens. Three examples are given in this paper where either strong deviations from the linear law are observed due to stress gradients or where the linear law yields wrong results because of three axial stresses. Special experimental techniques are described and formalisms are given for the evaluation of the corresponding stress fields which are in the described cases more complicated than usual.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 235 - 244
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Noyan, I.C. and Cohen, J.B., “Residual Stress, Measurement by Diffraction and Interpretation”, Springer, New York (1987).Google Scholar
2. Stickforth, J., Über den Zusammenhang zwischen röntgenographischer Gitterdehnung und makroskopischen elastischen Spannungen, Techn, Mitt. Krupp 24: 89, (1966).Google Scholar
3. Krier, J., Ruppersberg, H., Berveiller, M. and Lipinski, P., Elastic and plastic anisotropy effects on second order internal stresses in textured poly crystalline materials, Textures and Microstructures 14-18: 1147, (1991).Google Scholar
4. Ruppersberg, H., Detemple, I. and Krier, J., Evaluation of Strongly non-linear surface stress fields σxx(z) and σyy(z) from diffraction experiments, phys. stat. sol. (a) 116: 681, (1989).Google Scholar
5. Ruppersberg, H. and Detemple, I., Evaluation of the stress field in a ground steel plate from energy-dispersive X-ray diffraction experiments, Mat. Sci. Eng. A 161: 41, (1993).Google Scholar
6. Ruppersberg, H., Detemple, I. and Bauer, C., Evaluation of stress fields from energy-dispersive X-ray diffraction experiments, in: “Residual Stress”, Hauk, V., Hdugardy, H.P., Macherauch, E. and H.-D. Tietz, eds., DGM Informationsgesellschaft, Oberursel (1993), p. 171.Google Scholar
7. Ruppersberg, H., Detemple, I. and Krier, J., σxx(z) and oσyy(z) stress-fields calculated from diffraction experiments performed with synchrotron radiation in the Ω and Ψ - mode techniques, Z. f. Kristallographie 195: 189, (1991).Google Scholar
8. Zhu, X. and Predecki, P.K., Determination of depth profiles of X-ray diffraction data using a numerical method, Adv. X-Ray Anal. 37: (1994).Google Scholar
9. Hartmann, S., Schütz, J., Matheis, S., Berveiller, M. and Ruppersberg, H., Thermal expansion of cementite and its relation to thermally induced phase-specific stresses in ferritc-cementite mixtures, in: “Residual Stress”, V. Hauk, Hougardy, H.P., E. Machcrauch and H.-D. Tietz, eds., DGM Informationsgesellschaft (1993), p. 107.Google Scholar
10. Abuhasan, A., Balasingh, C. and P.K, Predecki, Residual stresses in alumina/silicon carbide (whisker) composites by X-ray diffraction, J. Am. Ceramic Soc. 73: 2474, (1990).Google Scholar
11. Munz, D. and Yang, Y.Y., Thermal stresses in joints of dissimilar materials, in: “Residual Stress”, V, Hauk, Hougardy, H.P., E. Macherauch and H.-D, Tietz, eds., DGM Informationsgesellschaft (1993), p. 157.Google Scholar
12. Ruppersberg, H., Formalism for the evaluation of pseudo-macro stress fields σ33(z) from Ω and Ψ-mode diffraction experiments performed with synchrotron radiation, Adv. X-Ray Anal 35: 481, (1992),Google Scholar
13. Detemple, I. and Ruppersberg, H., Evaluation of σ33(z) from diffraction experiments performed with synchrotron radiation in the Ω and Ψ- goniometries, Adv. X-Ray Anal. 37: (1994).Google Scholar
14. Winholtz, R.A. and Cohen, J.B., Separation of the macro- and micro- stresses in plastically deformed 1080 steel, Adv. X-Ray Anal, 32: 341, (1989).Google Scholar
15. Predecki, P.K., Determination of depth profiles from X-ray diffraction data, Powder Diffraction 8: 122, (1993).Google Scholar
16. Noyan, I.C., Effect of gradients in multi-axial stress states on residual stress measurements with X-rays, Metall. Trans. A14: 249, (1983).Google Scholar
17. Hartmann, S. and Ruppersberg, H., to be published.Google Scholar