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Correction for Non-Linearity of Proportional Counter Systems in Electron Probe X-Ray Microanalysis

Published online by Cambridge University Press:  06 March 2019

Kurt F. J. Heinrich ,
Donald Vieth  and
Harvey Yakowitz
Kurt F. J. Heinrich
Affiliation:
National Sureau of Standards, Washington, D.C.
Donald Vieth
Affiliation:
National Sureau of Standards, Washington, D.C.
Harvey Yakowitz
Affiliation:
National Sureau of Standards, Washington, D.C.
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Abstract

While the theoretical basis for the correction of non-linearity of detector systems is well known, methods for the determination of dead-time effects must be adapted to electron probe microanalyzer systems. Two such methods, one employing both X-ray and current measurements and the other employing simultaneous X-ray measurements on two spectrometers, are described. The effect of pulse-height shrinkage at high counting rates on the linearity of the detector system is discussed. When the proposed corrections for the dead-time of X-ray detector systems employing proportional counters are applied to the X-ray intensity measurements obtained with the electron probe microanalyzer, count rates as high as 50,000 counts/sec can be used.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 208 - 220
Copyright
Copyright © International Centre for Diffraction Data 1965

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