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Oriented Single Crystals of Aluminum for X-Ray Analysis*

Published online by Cambridge University Press:  06 March 2019

Joseph M. Dhosi ,
Charles P. Gazzara  and
Raymond M. Middleton
Joseph M. Dhosi
Affiliation:
Watertown Arsenal Laboratories, Watertown, Massachusetts
Charles P. Gazzara
Affiliation:
Watertown Arsenal Laboratories, Watertown, Massachusetts
Raymond M. Middleton
Affiliation:
Watertown Arsenal Laboratories, Watertown, Massachusetts
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Abstract

A simple gradient heating apparatus was developed and used successfully in growing oriented single crystals of high-purity aluminum suitable for X-ray dinfraction analysis.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 6: Eleventh Annual Conference on Applications of X-ray Analysis, August 8-10, 1962 , 1962 , pp. 172 - 176
Copyright
Copyright © International Centre for Diffraction Data 1962

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Footnotes

*

The statements and opinions expressed in this article are those of the Authors and do not necessarily indicate the views or policy of the Army Ordnance Corps.

References

1. Elbaum, C., “Dislocation in Metal Crystals Grown from the Melt,” J. Appl. Phys. 31: 1413, 1960.Google Scholar
2. Howe, S. and Elbaum, C., “Dislocation Free Aluminum Crystals,” J. AppL Phys. 32:742, 1961.Google Scholar
3. Honeycombs, R. W., “The Growth of Metal Single Crystals,” Metal. Rev. 4(13) : 1, 1959.Google Scholar
4. Hagg, G. and Karlsson, N., “Aluminum Monochromator with Double Curvature for High Intensity X-ray Powder Photographs,” Acta Cryst. 5: 728, 1952.Google Scholar