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Adaptation of the Fundamental Parameters Monte Carlo Simulation to EDXRF Analysis with Secondary Fluorescer X-Ray Machines

Published online by Cambridge University Press:  06 March 2019

R. P. Gardner ,
L. Wielopolski  and
J. M. Doster
R. P. Gardner
Affiliation:
Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27607
L. Wielopolski
Affiliation:
Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27607
J. M. Doster
Affiliation:
Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27607
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Abstract

The Monte Carlo simulation method that has been previously developed and demonstrated for EDXRF analysis with annular radioisotope excitation sources is extended to systems using secondary fluorescer X-ray machines for excitation. Comparisons of the Monte Carlo predictions with experimental results indicate that the modification is valid.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 129 - 142
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

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