Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-24T09:01:01.339Z Has data issue: false hasContentIssue false
  • English
  • Français

An Automated Electron Microprobe System

Published online by Cambridge University Press:  06 March 2019

F. Kunz ,
E. Eichen ,
H. Matthews  and
J. Francis
F. Kunz
Affiliation:
Ford Motor Company Dearborn, Michigan
E. Eichen
Affiliation:
Ford Motor Company Dearborn, Michigan
H. Matthews
Affiliation:
Canberra Industries Meriden, Connecticut
J. Francis
Affiliation:
Canberra Industries Meriden, Connecticut
Get access

Abstract

An automated- electron microprobe system using an on-line 8,000 word minicomputer has been designed. The general principles and need for such a system is discussed. The microprobe-computer interface hardware consists of computer addressable axis positioners, scalers, timer and a digital to analog converter. The axis positioners are used to position the spectrometers and specimen stage, whereas the digital to analog converter is used to position the electron beam in a 1000 × 1000 point matrix. The digital to analog converter is also used to drive a X-Y recorder for computer plotting of calibration curves, pulse amplitude distributions, X-ray line profiles and wavelength scans. System software is written in the interactive CLASS language which was designed specifically for laboratory instrument control. The language permits large computer programs to be chained through a minicomputer while passing variables from one function to the next. The operating software consists of automatic peak location, sequencing of data collection, statistical analysis of data, and correction of data for fluorescence, absorption and atomic number effects. An automated quantitative analysis of several copper-gold alloys and a computerized test for specimen homogeneity is described to demonstrate system operation. Future automation considerations are also discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 148 - 163
Copyright
Copyright © International Centre for Diffraction Data 1971

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Miller, D. C., “Results Obtained with the Modified Norelco Autrometer,” in Mueller, W. M., Editor, Advances in X-ray Analysis, Vol. 1, p. 283–295, Plenum Press (1957).Google Scholar
2. Castaing, R., “Electron Probe Microanalysis,” Advances in Electronics and Electron Physics, Vol. 13, Academic press, New York (1960).Google Scholar
3. Colby, J. W., “Quantitative Microprobe Analysis of Thin Dielectric Films,” in Vratny, F., Editor, Thin Film Dielectrics, The Electrochemical Society, Incorporated (1968).Google Scholar
4. Beaman, D. R., “A Critical Examination of Computer Programs Used in Quantitative Electron Microprobe Analysis,” Anal. Chem. Vol. 42, p. 1540–1568, 1970.Google Scholar
5. Eichen, S., Kunz, F., Matthews, J. I., “An Automated Electron Microprobe Analyzer,” Proceedings Fifth National Conference on Electron Microprobe Analysis, Electron Probe Analysis Society of America, (1970).Google Scholar
6. Wolf, R. and Saffir, A., “A Computerized Electron Microprobe,” ibid., Paper No. 6.Google Scholar
7. Chambers, W. F., “A Computer Assisted Microprobe laboratory,” ibid., Paper No. 7.Google Scholar
8. Merrill, J. and J.DuMond, “Precision Measurement of L X-Ray Wavelengths and Line Widths for 74 ≤ Z ≤95 and Their Interpretation'in Terms of Nuclear Perturbations,” Annals of Phy. Vol. 14, p. 166–228, 1961.Google Scholar
9. Evans, R., The Atomic Nucleus, McGraw-Hill Book Company, New York, N.Y. (1955).Google Scholar
10. Colby, J., MAGIC: Version III, personal communication.Google Scholar
11. Philibert, J. and R.Tixier, “Some Problems with Quantitative Electron Probe Microanalysis,” in Heinrich, K. F. J., Editor, Quantitative Electron Probe Microanalysis, p. 14, NBS Special Publ, 298 (1968).Google Scholar
12. Ibid., p. 15.Google Scholar
13. Yakowitz, H., Veith, D., and Michaelis, R., “Homogeneity Characterisation of NBS Spectrometric Standards III: White Cast Iron and Stainless Steel Powder Compact,” NBS Misc. Publ, 260-12, (1966).Google Scholar
14. Yakowitz, H., Veith, D., Heinrich, K. and Michaelis, R., Homogeneity Characterization of NBS Spectrometric Standards II: Cartridge Brass and Low-Alloy Steel,” NBS Misc. Publ. 260-10, (1968).Google Scholar
15. Yakowits, H., Michaelis, R. and Veith, D., “Homogeneity Characterisation of UBS Spectrometric Standards IV: Preparation and Microprobe Characterisation of W-20% Mo Alloy Fabricated by Powder Metallurgical Methods,” Advances in X-Ray Analysis, Vol. 12, p. 418, Plenum Press (1969).Google Scholar
16. Minutes of Midwest Probe Users Group, dated March 14, 1968.Google Scholar
17. Varshneya, A. and Cooper, A., “Inhomogeneities and Iron Diffusion in a Thailand Tekite,” J. Geophys. Res., Vol. 27, p.6845, 1969.Google Scholar
18. Dixon, W. and Massey, F., Introduction to Statistical Analysis, (second edition), McGraw-Hill Book Company, New York, (1957).Google Scholar