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An X-Ray Study of Ion-Implanted Liquid Phase Epitaxial Garnet Films with a Single Crystal Dirfractometer
Published online by Cambridge University Press: 06 March 2019
Abstract
A vertical scanning single crystal diffractometer with graphite monochromator and narrow divergent beam controlled by an IBM Series/1 computer was used to study crystal damage in the ion-implanted garnet films including strain effects induced by multi-implantation processes as a function of the types of ions, their energies and doses, growth and annealing temperatures.
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- Copyright © International Centre for Diffraction Data 1980