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Analysis of the Thermo-Structural Behavior of Polyethylene Using Simultaneous DSC/XRD

Published online by Cambridge University Press:  06 March 2019

C. E. Crowder ,
S. Wood ,
B. G. Landes ,
R. A. Newman ,
J. A. Blazy  and
R. A. Bubeck
C. E. Crowder
Affiliation:
Michigan Applied Science and Technology Laboratories The Dow Chemical Company Midland, Michigan
S. Wood
Affiliation:
Michigan Applied Science and Technology Laboratories The Dow Chemical Company Midland, Michigan
B. G. Landes
Affiliation:
Michigan Applied Science and Technology Laboratories The Dow Chemical Company Midland, Michigan
R. A. Newman
Affiliation:
Michigan Applied Science and Technology Laboratories The Dow Chemical Company Midland, Michigan
J. A. Blazy
Affiliation:
Michigan Applied Science and Technology Laboratories The Dow Chemical Company Midland, Michigan
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Extract

Over the past 25 years, numerous studies of polymers utilizing both X-ray diffraction (XRD) and differential scanning calorimetry (DSC) have been reported in the literature. These studies have suffered because the two techniques must be performed on separate samples and under conditions that are often dissimilar. By combining the two techniques into one instrument, typical problems encountered with variations in sample preparation and thermal and atmospheric environment are eliminated. This is quite important in the study of polymers since one must match not only temperatures between the two techniques, but also heating rates as well. Matched thermal conditions are necessary because polymer properties such as crystallinity and crystallite size depend on both the temperature and thermal history of the sample under study.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 315 - 322
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

1. Fawcett, T.G., et.al., The Rapid Simultaneous Measurement of Thermal and Structural Data by a Novel DSC/XRD Instrument, Advances in X-ray Analysis, Vol. 28, Barrett, Predecki, and Leyden, eds., Plenum, 1985, p. 227.Google Scholar
2. Brown, A., Edmonds, J.W., The Fitting of Powder Diffraction Profiles to an Analytical Expression and the Influence of Line Broadening Factors, Advances in X-ray Analysis, Vol. 23, Rhodes, J., ed., Plenum, 1985, p. 361.Google Scholar
3. Matthews, J.L., Peiser, H.S., and Richards, R.B., The X-ray Measurement of the Amorphous Content of Polythene Samples, Acta Cryst., Vol. 2. (1949), p. 85.Google Scholar