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Application of Imaging Plate for X-Ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

Atsushi Shibata ,
Katsunari Sasaki  and
Takao Kinefuchi
Atsushi Shibata
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho, Akishima-shi Tokyo 196, Japan
Katsunari Sasaki
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho, Akishima-shi Tokyo 196, Japan
Takao Kinefuchi
Affiliation:
Rigaku Corporation 3-9-12 Matsubara-cho, Akishima-shi Tokyo 196, Japan
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Abstract

The Fuji Imaging Plate (IP) is a 2-dimensional detector in which a latent X-ray image is stored as a distribution of color centers on a photostimulable phosphor (BaFBr:Eu2+) screen. It has a large effective area, wide dynamic range and high sensitivity. Thus it has been widely used not only in medical but also in scientific and industrial fields. Particularly in X-ray structure analysis, mainly of proteins, it has been used extensively and achieved good results.

On the other hand, few applications have been reported in the field except for structure analysis, in spite of the superior performance of the IP which will give significant advantages in various measurements which have been done using an X-ray film such as electric device and fiber specimen.

Therefore we report here the basic performance of R-AXIS II(Rigaku Automated X-Ray Imaging System II), an IP reader made by Rigaku, and some applications of X-ray diffraction measurements using IP.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 407 - 413
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Miyahara, J., Takahashi, K., Amemiya, Y., N.Kamiya, and Y. Sato. Nucl. Instr. Meth. A246 (1986), 572.Google Scholar
2. Sato, M., Yamamoto, M., Imada, K., Katsube, Y., Tanaka, N. and T. Higashi. submitted to J.Appl. Crystallogr. (1991).Google Scholar